Physical properties obtained from measurement model analysis of impedance measurements
By Liao, Hangqi; Watson, William; Dizon, Arthur; Tribollet, Bernard; Vivier, Vincent; Orazem, Mark E.
Published in Electrochimica Acta
Electrochimica Acta
2020
Abstract
The Voigt measurement model is regressed to synthetic data to demonstrate its ability to extract capacitance, ohmic resistance, and polarization resistance values from impedance data. The systems explored include a Randles circuit, films with exponential and power-law distributions of resistivity, systems exhibiting geometric capacitance, and systems showing geometry-induced frequency dispersion. The Voigt measurement model is also regressed to complex capacitance to identify the high-frequency limit in Cole